AFM探针描述
适用的Sample:
Ceramics,Other Hard Samples,Other Soft Sample,Polymers
适用的AFM机型:
DimensionIcon,DimensionXR,Innova,JPK,MultiMode,Non-Bruker
适用的Work Mode:
contact,peakforce tapping,tapping or non-contact,Torsional Resonance (TR)
适用的Application:
General Topography,Mechanical Force Curves
Coating 描述
cantilever Back side coating | Reflective Aluminum |
---|---|
tip coating | -- |
Tip 规格
tip geometry | Standard (Steep) |
---|---|
tip radius (Nom) | 8nm |
tip height | 10-15um |
Front Angle (FA) | 25±2.5° |
Back Angle (BA) | 15±2.5° |
Side Angle (SA) | 22.5±2.5° |
Cantilever 规格
cantilever geometry | Rectangular |
---|---|
K(Nom) | 2.8N/m |
Frequency(Nom) | 75KHz |
length(Nom) | 230um |
thickness(Nom) | 2.75um |
cantilever material | 0.01 - 0.025 Ωcm Antimony (n) doped Si |
top layer back | -- |
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Frequency
Nom:
70KHz
Spring Const.
Nom:
2.9N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
Frequency
Nom:
300KHz
Spring Const.
Nom:
42N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
Frequency
Nom:
300KHz
Spring Const.
Nom:
42N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum