SAA-HPI-SS
  • Manufacturer: Bruker
  • Cantilever Coating: B: Reflective Aluminum
  • Tip Geometry: Rotated
  • Number of Cantilevers: 1个悬臂
    F55KHz K0.25N/m L110um
AFM探针描述

适用的Sample:
Bio Molecules,Ceramics,Data Storage,Other Hard Samples,Other Soft Sample,Polymers,Semiconductors

适用的AFM机型:
BiosescopeResolve,DimensionFastScan,DimensionIcon,DimensionXR,JPK,MultiMode

适用的Work Mode:
peakforce tapping,ScanAsyst

适用的Application:
General Topography,Holes/ Trenches,Ultra Hi-Res

Coating 描述
cantilever Back side coating Reflective Aluminum
tip coating --
Tip 规格
tip geometry Rotated
tip radius (Nom) 1nm
tip height 3-8um
Front Angle (FA) 15°
Back Angle (BA) 25°
Cantilever 规格
cantilever geometry Special
K(Nom) 0.25N/m
Frequency(Nom) 55KHz
length(Nom) 110um
thickness(Nom) 0.58um
cantilever material Silicon Nitride
top layer back --
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Frequency
Nom: 70KHz
Spring Const.
Nom: 2.9N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
Frequency
Nom: 300KHz
Spring Const.
Nom: 42N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
Frequency
Nom: 300KHz
Spring Const.
Nom: 42N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
Frequency
Nom: 70KHz
Spring Const.
Nom: 2.9N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
探针对比
探针型号对比
开始对比 最多4个
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